—Variations of process parameters have an important impact on reliability and yield in deep sub micron IC technologies. One methodology to estimate the influence of these effects...
Abstract. Embedded system design complexities are growing exponentially. Demand has increased for modeling techniques that can provide both accurate measurements of delay and fast ...
It is becoming increasingly important to be able to adapt an application’s behavior at run time in response to changing requirements and environmental conditions. Adaptive progr...
This work is devoted to constraint solving motivated by the debugging of constraint logic programs a la GNU-Prolog. The paper focuses only on the constraints. In this framework, c...
—It has been shown that the Universum data, which do not belong to either class of the classification problem of interest, may contain useful prior domain knowledge for training...