1912 search results - page 206 / 383 » Don't Compare Averages |
116
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VTS
2008
IEEE
15 years 8 months ago
2008
IEEE
—Wafer-level test during burn-in (WLTBI) is a promising technique to reduce test and burn-in costs in semiconductor manufacturing. However, scan-based testing leads to significa...
108
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WCNC
2008
IEEE
15 years 8 months ago
2008
IEEE
— In this paper, we compare the performance of wireless local area networks (WLANs) with single-user MIMO (SU-MIMO) and multi-user MIMO (MU-MIMO) in terms of collision probabilit...
115
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AI
2008
Springer
15 years 8 months ago
2008
Springer
Abstract. Conventional web search engines retrieve too many documents for the majority of the submitted queries; therefore, they possess a good recall, since there are far more pag...
107
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CCGRID
2007
IEEE
15 years 8 months ago
2007
IEEE
Maximizing resource provider profit and satisfying user requirements at the same time is a challenging problem in utility computing environments. In this paper, we introduce adap...
150
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CODES
2007
IEEE
15 years 8 months ago
2007
IEEE
Instruction Set Simulation (ISS) is widely used in system evaluation and software development for embedded processors. Despite the significant advancements in the ISS technology,...