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ITC
2003
IEEE
158views Hardware» more  ITC 2003»
15 years 8 months ago
Extraction Error Diagnosis and Correction in High-Performance Designs
Test model generation is crucial in the test generation process of a high-performance design targeted for large volume production. A key process in test model generation requires ...
Yu-Shen Yang, Jiang Brandon Liu, Paul J. Thadikara...
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EUROPAR
2004
Springer
15 years 7 months ago
Lookahead Scheduling for Reconfigurable GRID Systems
Abstract This paper proposes an approach to continuously optimizing parallel scientific applications with dynamically changing architectures. We achieve this by combining a dynamic...
Jesper Andersson, Morgan Ericsson, Welf Löwe,...