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Dynamic Process Composition and Communication Patterns in Ir...
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On-chip Scan-Based Test Strategy for a Dependable Many-Core Processor Using a NoC as a Test Access Mechanism
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—Periodic on-chip scan-based tests have to be applied to a many-core processor SoC to improve its dependability. An infrastructural IP module has been designed and incorporated i...
Xiao Zhang, Hans G. Kerkhoff, Bart Vermeulen
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