In this paper, we present results for significantly improving the performance of sequential circuit diagnostic test pattern generation (DATPG). Our improvements are achieved by de...
This paper presents an efficient algorithm for the generation of diagnostic test patterns which distinguish between two arbitrary single stuck-at faults. The algorithm is able to ...
In this paper we propose an efficient transient test generation method to comprehensively test analog circuits using minimum test time. A divide and conquer strategy is formulated...
We consider the problem of built-in test generation for synchronous sequential circuits. The proposed scheme leaves the circuit flip-flops unmodified, and thus allows at-speed ...
This paper presents new test generation techniques for improving the average-case performance of the iterative logic array based deterministic sequential circuit test generation a...