—As semiconductor manufacturing enters advanced nanometer design paradigm, aging and device wear-out related degradation is becoming a major concern. Negative Bias Temperature In...
Attackers often take advantage of vulnerabilities in benign software, and the authors of benign software must search their code for bugs in hopes of finding vulnerabilities before...
Juan Caballero, Pongsin Poosankam, Stephen McCaman...
Energy efficiency is rapidly becoming a first class optimization parameter for modern systems. Caches are critical to the overall performance and thus, modern processors (both hig...
Today, one can observe an ever increasing trend in the use of mobile systems. This change inevitably affects the software running on such devices by necessitating additional functi...
Nearchos Paspallis, Avraam Chimaris, George A. Pap...
: As scan compression replaces the traditional scan it is important to understand how it works with power. DFT MAX represents one of the two primary scan compression solutions used...