Test application time is an important factor in the overall cost of VLSI chip testing. We present a new ATPG approach for generating compact test sequences for sequential circuits...
Yanti Santoso, Matthew C. Merten, Elizabeth M. Rud...
In this paper, we describe the use of a modern learning classifier system to a data mining task. In particular, in collaboration with a medical specialist, we apply XCS to a prima...
A fault-oriented sequential circuit test generator is described in which various types of distinguishing sequences are derived, both statically and dynamically, to aid the test ge...
Michael S. Hsiao, Elizabeth M. Rudnick, Janak H. P...
Procedural representations of control policies have two advantages when facing the scale-up problem in learning tasks. First they are implicit, with potential for inductive genera...
Abstract. Disease processes in patients are temporal in nature and involve uncertainty. It is necessary to gain insight into these processes when aiming at improving the diagnosis,...