761 search results - page 39 / 153 » Effectiveness Improvement of ECR Tests |
VTS
2002
IEEE
15 years 2 months ago
2002
IEEE
Very Low Voltage (VLV) testing has been proposed to increase flaw detection in bulk silicon CMOS integrated circuits and this paper explores these and additional advantages in the...
SAFECOMP
1999
Springer
15 years 2 months ago
1999
Springer
We present an ongoing experience aimed at introducing statistical process control techniques to one crucial test phase, namely Function Test, of a real world software development p...
WSC
2007
15 years 2 days ago
2007
Computer simulation is effective in improving the efficiency of manufacturing system design, operation, and maintenance. Most simulation models are usually tailored to address a n...
ENGL
2007
14 years 9 months ago
2007
— Using computer simulated tests, this study examined direction-of-motion stereotypes and response times for different configurations of lever controls and circular displays. Qua...
CHI
2005
ACM
15 years 10 months ago
2005
ACM
Designers of children's technology are often more interested in user motivation than those who design systems for adults. Since children's technology often has aims such...