761 search results - page 97 / 153 » Effectiveness Improvement of ECR Tests |
FGCS
1992
14 years 11 months ago
1992
: There have been no major control problems during the first three years of the new Tokaido-Sanyo Shinkansen (bullet train) Programmed Route Control (PRC) computer system. Prior to...
110
click to vote
CVPR
2009
IEEE
16 years 5 months ago
2009
IEEE
We introduce a text-based image feature and demon-
strate that it consistently improves performance on hard
object classification problems. The feature is built using
an auxilia...
CVPR
2004
IEEE
15 years 12 months ago
2004
IEEE
We present a new approach to appearance-based object recognition, which captures the relationships between multiple model views and exploits them to improve recognition performanc...
DAC
2009
ACM
15 years 10 months ago
2009
ACM
Silicon nanowires are a promising solution to address the increasing challenges of fabrication and design at the future nodes of the Complementary Metal-Oxide-Semiconductor (CMOS)...
106
click to vote
DAC
2003
ACM
15 years 10 months ago
2003
ACM
Chemical-mechanical planarization (CMP) and other manufacturing steps in very deep-submicron VLSI have varying effects on device and interconnect features, depending on the local ...