275 search results - page 21 / 55 » Efficient Identification of Design Patterns with Bit-vector ... |
105
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TVLSI
2010
14 years 6 months ago
2010
Abstract--Higher circuit densities in system-on-chip (SOC) designs have led to drastic increase in test data volume. Larger test data size demands not only higher memory requiremen...
ECEASST
2006
14 years 11 months ago
2006
Motivated by the promotion of rewriting techniques and their use in major industrial applications, we have designed Tom: a pattern matching layer on top of conventional programming...
AINA
2010
IEEE
15 years 4 months ago
2010
IEEE
—Network Intrusion Detection System (NIDS) is a system which can detect network attacks resulted from worms and viruses on the Internet. An efficient pattern matching algorithm p...
106
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DAC
2010
ACM
15 years 3 months ago
2010
ACM
Fault simulation is essential in test generation, design for test and reliability assessment of integrated circuits. Reliability analysis and the simulation of self-test structure...
103
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KDD
2005
ACM
16 years 3 days ago
2005
ACM
One fundamental task in near-neighbor search as well as other similarity matching efforts is to find a distance function that can efficiently quantify the similarity between two o...