24 search results - page 4 / 5 » Efficient Testing of Clock Regenerator Circuits in Scan Desi... |
ISLPED
2007
ACM
14 years 11 months ago
2007
ACM
Negative bias temperature instability (NBTI) has become a dominant reliability concern for nanoscale PMOS transistors. In this paper, we propose variable-latency adder (VL-adder) ...
97
Voted
DAC
2000
ACM
15 years 10 months ago
2000
ACM
In this paper we describe an area efficient power minimization scheme "Control Generated ClockingI` that saves significant amounts of power in datapath registers and clock dr...
DATE
2008
IEEE
15 years 4 months ago
2008
IEEE
— As the feature size of transistors gets smaller, fabricating them becomes challenging. Manufacturing process follows various corrective design-for-manufacturing (DFM) steps to ...
ENTCS
2008
14 years 9 months ago
2008
This paper reports on the design of a test chip built to test a) a new latency insensitive network fabric protocol and circuits, b) a new synchronizer design, and c) how efficient...
GLVLSI
2010
IEEE
15 years 2 months ago
2010
IEEE
Clock skew variations adversely affect timing margins, limiting performance, reducing yield, and may also lead to functional faults. Non-tree clock distribution networks, such as ...