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ITC
1993
IEEE
110views Hardware» more  ITC 1993»
15 years 1 months ago
Novel Test Pattern Generators for Pseudo-Exhaustive Testing
ÐPseudoexhaustive testing of a combinational circuit involves applying all possible input patterns to all its individual output cones. The testing ensures detection of all detecta...
Rajagopalan Srinivasan, Sandeep K. Gupta, Melvin A...
70
Voted
DATE
2003
IEEE
93views Hardware» more  DATE 2003»
15 years 2 months ago
Comparison of Test Pattern Decompression Techniques
Test pattern decompression techniques are bounded with the algorithm of test pattern ordering and test data flow controlling. Some of the methods could have more sophisticated sor...
Ondrej Novák
TSE
2010
155views more  TSE 2010»
14 years 4 months ago
Incremental Test Generation for Software Product Lines
Recent advances in mechanical techniques for systematic testing have increased our ability to automatically find subtle bugs, and hence to deploy more dependable software. This pap...
Engin Uzuncaova, Sarfraz Khurshid, Don S. Batory
DAC
2003
ACM
15 years 2 months ago
Test generation for designs with multiple clocks
To improve the system performance, designs with multiple clocks have become more and more popular. In this paper, several novel test generation procedures are proposed to utilize ...
Xijiang Lin, Rob Thompson
ITC
1997
IEEE
92views Hardware» more  ITC 1997»
15 years 1 months ago
A Novel Functional Test Generation Method for Processors Using Commercial ATPG
As the sizes of general and special purpose processors increase rapidly, generating high quality manufacturing tests for them is becoming a serious problem in industry. This paper...
Raghuram S. Tupuri, Jacob A. Abraham