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72
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ICCAD
2009
IEEE
101views Hardware» more  ICCAD 2009»
14 years 10 months ago
Compacting test vector sets via strategic use of implications
As the complexity of integrated circuits has increased, so has the need for improving testing efficiency. Unfortunately, the types of defects are also becoming more complex, which...
Nuno Alves, Jennifer Dworak, R. Iris Bahar, Kundan...
ISPW
2009
IEEE
15 years 7 months ago
Bridge the Gap between Software Test Process and Business Value: A Case Study
For a software project to succeed, acceptable quality must be achieved within an acceptable cost, providing business value to the customers, and keeping delivery time short. Softwa...
Qi Li, Mingshu Li, Ye Yang, Qing Wang, Thomas Tan,...
96
Voted
DSD
2006
IEEE
126views Hardware» more  DSD 2006»
15 years 6 months ago
Off-Line Testing of Delay Faults in NoC Interconnects
Testing of high density SoCs operating at high clock speeds is an important but difficult problem. Many faults, like delay faults, in such sub-micron chips may only appear when th...
Tomas Bengtsson, Artur Jutman, Shashi Kumar, Raimu...
95
Voted
ICSEA
2006
IEEE
15 years 6 months ago
A Partition-Based Approach for XPath Testing
—The XML language is becoming the preferred means of data interchange and representation in web based applications. Usually, XML data is stored in XML repositories, which can be ...
Claudio de la Riva, José García-Fanj...
93
Voted
EUROGP
2003
Springer
101views Optimization» more  EUROGP 2003»
15 years 6 months ago
An Enhanced Framework for Microprocessor Test-Program Generation
Test programs are fragment of code, but, unlike ordinary application programs, they are not intended to solve a problem, nor to calculate a function. Instead, they are supposed to ...
Fulvio Corno, Giovanni Squillero