4192 search results - page 140 / 839 » Efficient testing of groups |
96
Voted
ICCAD
1999
IEEE
15 years 5 months ago
1999
IEEE
We present optimal solutions to the test scheduling problem for core-based systems. We show that test scheduling is equivalent to the m-processor open-shop scheduling problem and ...
83
Voted
ITC
1997
IEEE
15 years 4 months ago
1997
IEEE
As the sizes of general and special purpose processors increase rapidly, generating high quality manufacturing tests for them is becoming a serious problem in industry. This paper...
106
Voted
VTS
1997
IEEE
15 years 4 months ago
1997
IEEE
A stress procedure for reliability screening, SHOrt Voltage Elevation (SHOVE) test, is analyzed here. During SHOVE, test vectors are run at higher-than-normal supply voltage for a...
DATE
2006
IEEE
15 years 6 months ago
2006
IEEE
In this paper we analyze the test power of SRAM memories and demonstrate that the full functional precharge activity is not necessary during test mode because of the predictable a...
92
Voted
VTS
2000
IEEE
15 years 5 months ago
2000
IEEE
We present a low-cost on-line test methodology for RTL controller-datapath pairs, based on the notion of path invariance. The fundamental observation supporting the proposed metho...