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ICCAD
1998
IEEE
116views Hardware» more  ICCAD 1998»
15 years 5 months ago
On primitive fault test generation in non-scan sequential circuits
A method is presented for identifying primitive path-delay faults in non-scan sequential circuits and generating robust tests for all robustly testable primitive faults. It uses t...
Ramesh C. Tekumalla, Premachandran R. Menon
96
Voted
SNPD
2008
15 years 2 months ago
Testing Component-Based Real Time Systems
This paper focuses on studying efficient solutions for modeling and deriving compositional tests for component-based real-time systems. In this work, we propose a coherent framewo...
Rachid Bouaziz, Ismail Berrada
94
Voted
ICSE
2008
IEEE-ACM
16 years 1 months ago
Using JULE to generate a compliance test suite for the UML standard
The Java-UML Lightweight Enumerator (JULE) tool implements a vitally important aspect of the framework for software tool certification - test suite generation. The framework uses ...
Panuchart Bunyakiati, Anthony Finkelstein, James S...
93
Voted
ATS
2005
IEEE
84views Hardware» more  ATS 2005»
15 years 6 months ago
Current Testing for Nanotechnologies: A Demystifying Application Perspective.
: This paper addresses the challenges imposed on current testing with the advent of Nanotechnologies. It shows why existing measurement solutions embedded in ATE systems are not ad...
Hans A. R. Manhaeve
76
Voted
ITC
2000
IEEE
80views Hardware» more  ITC 2000»
15 years 5 months ago
A stand-alone integrated test core for time and frequency domain measurements
An area efficient and robust integrated test core for mixed-signal circuits is described. The core consists of a completely digital implementation, except for a simple reconstructi...
Mohamed Hafed, Nazmy Abaskharoun, Gordon W. Robert...