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UML
2001
Springer
15 years 5 months ago
A UML-Based Approach to System Testing
System testing is concerned with testing an entire system based on its specifications. In the context of object-oriented, UML development, this means that system test requirements ...
Lionel C. Briand, Yvan Labiche
ITC
1998
IEEE
71views Hardware» more  ITC 1998»
15 years 5 months ago
A structured and scalable mechanism for test access to embedded reusable cores
The main objective of core-based IC design is improvement of design efficiency and time-to-market. In order to prevent test development from becoming the bottleneck in the entire ...
Erik Jan Marinissen, Robert G. J. Arendsen, Gerard...
DELTA
2004
IEEE
15 years 4 months ago
Scan Test of IP Cores in an ATE Environment
Manufacturing test of chips made of multiple IP cores requires different techniques if ATE is used. As scan chains are commonly used as access paths to the DUT, ATE architectures ...
Luca Schiano, Yong-Bin Kim, Fabrizio Lombardi
CORR
2010
Springer
152views Education» more  CORR 2010»
14 years 10 months ago
Evolutionary Approach to Test Generation for Functional BIST
In the paper, an evolutionary approach to test generation for functional BIST is considered. The aim of the proposed scheme is to minimize the test data volume by allowing the dev...
Y. A. Skobtsov, D. E. Ivanov, V. Y. Skobtsov, Raim...
JAR
2010
98views more  JAR 2010»
14 years 7 months ago
Proof-Guided Test Selection from First-Order Specifications with Equality
This paper deals with test case selection from axiomatic specifications whose axioms are quantifier-free first-order formulas with equality. We first prove the existence of an ide...
Delphine Longuet, Marc Aiguier, Pascale Le Gall