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SIGSOFT
2003
ACM
16 years 1 months ago
Leveraging field data for impact analysis and regression testing
Software products are often released with missing functionality, errors, or incompatibilities that may result in failures, inferior performances, or user dissatisfaction. In previ...
Alessandro Orso, Taweesup Apiwattanapong, Mary Jea...
103
Voted
ICCAD
2002
IEEE
116views Hardware» more  ICCAD 2002»
15 years 9 months ago
Conflict driven techniques for improving deterministic test pattern generation
This work presents several new techniques for enhancing the performance of deterministic test pattern generation for VLSI circuits. The techniques introduced are called dynamic de...
Chen Wang, Sudhakar M. Reddy, Irith Pomeranz, Xiji...
105
Voted
IPPS
2007
IEEE
15 years 7 months ago
Period-Dependent Initial Values for Exact Schedulability Test of Rate Monotonic Systems
Real-time systems using Rate Monotonic fixed priority scheduling can be checked for schedulability either by pessimistic schedulability conditions or exact testing. Exact testing ...
Wan-Chen Lu, Kwei-Jay Lin, Hsin-Wen Wei, Wei Kuan ...
ECBS
2005
IEEE
160views Hardware» more  ECBS 2005»
15 years 6 months ago
Traceability-Driven Model Refinement for Test Case Generation
Testing complex Computer-Based Systems is not only a demanding but a very critical task. Therefore the use of models for generating test data is an important goal. Tool support du...
Matthias Riebisch, Michael Hübner
DFT
2000
IEEE
105views VLSI» more  DFT 2000»
15 years 5 months ago
Low-Speed Scan Testing of Charge-Sharing Faults for CMOS Domino Circuits
Because domino logic design offers smaller area and higher speed than complementary CMOS design, it has been very popularly used to design highperformance processors. However: dom...
Ching-Hwa Cheng, Jinn-Shyan Wang, Shih-Chieh Chang...