4192 search results - page 169 / 839 » Efficient testing of groups |
108
click to vote
DATE
2004
IEEE
15 years 4 months ago
2004
IEEE
Due to process variations in deep sub-micron (DSM) technologies, the effects of timing defects are difficult to capture. This paper presents a novel coverage metric for estimating...
115
Voted
ICES
2000
Springer
15 years 4 months ago
2000
Springer
Testing is a key issue in the design and production of digital circuits: the adoption of BIST (Built-In Self-Test) techniques is increasingly popular, but requires efficient algori...
131
click to vote
PTS
2007
15 years 2 months ago
2007
The interrelationship between software faults and failures is quite intricate and obtaining a meaningful characterization of it would definitely help the testing community in decid...
125
Voted
JMLR
2010
14 years 7 months ago
2010
Kernel techniques have long been used in SVM to handle linearly inseparable problems by transforming data to a high dimensional space, but training and testing large data sets is ...
97
Voted
DAC
2003
ACM
16 years 1 months ago
2003
ACM
Functional verification is widely acknowledged as the bottleneck in the hardware design cycle. This paper addresses one of the main challenges of simulation based verification (or...