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121
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ETS
2009
IEEE
14 years 10 months ago
2009
IEEE
Scan circuit generally causes excessive switching activity compared to normal circuit operation. The higher switching activity in turn causes higher peak power supply current whic...
84
Voted
DELTA
2008
IEEE
15 years 7 months ago
2008
IEEE
The advances of CMOS technology towards 45 nm, the high costs of ASIC design, power limitations and fast changing application requirements have stimulated the usage of highly reco...
89
Voted
FMCAD
2007
Springer
15 years 7 months ago
2007
Springer
— The concept of applying partial fencing to logic built-in self test (LBIST) hardware structures for the purpose of using partially good chips is well known in the chip design i...
115
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DSD
2005
IEEE
15 years 6 months ago
2005
IEEE
We describe a new e-learning environment and a runtime platform for educational tools on digital system testing and design for testability. This environment is being developed in ...
119
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CONCUR
2006
Springer
15 years 4 months ago
2006
Springer
Boolean programs with recursion are convenient abstractions of sequential imperative programs, and can be represented as recursive state machines (RSMs) or pushdown automata. Motiv...