We present a parallel code generation algorithm for complete applications and a new experimental methodology that tests the efficacy of our approach. The algorithm optimizes for d...
Fault simulation is essential in test generation, design for test and reliability assessment of integrated circuits. Reliability analysis and the simulation of self-test structure...
Michael A. Kochte, Marcel Schaal, Hans-Joachim Wun...
In this paper, we present a new evaluation approach for missing data techniques (MDTs) where the efficiency of those are investigated using listwise deletion method as reference....
Seliz G. Karadogan, Letizia Marchegiani, Lars Kai ...
- We propose a framework to unify the process of false paths and multi-cycle paths in static timing analysis (STA). We use subgraphs attached with timing constraints to represent f...
Shuo Zhou, Bo Yao, Hongyu Chen, Yi Zhu, Chung-Kuan...
We present a new variant of the Earley parsing algorithm capable of efficiently supporting context-free grammars with regular right hand-sides. We present the core state-machine d...