4192 search results - page 185 / 839 » Efficient testing of groups |
115
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AINA
2005
IEEE
15 years 6 months ago
2005
IEEE
In a secret sharing scheme based upon access structures, each group has an authorization and only the participants who stayed in an authorized access structure can recover the sec...
138
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ATS
1998
IEEE
15 years 5 months ago
1998
IEEE
This paper presents a new effective Built-In Self Test (BIST) scheme that achieves 100% fault coverage with low area overhead, and without any modification of the circuit under tes...
102
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CONSTRAINTS
2007
15 years 29 days ago
2007
In the ECAD area, the Test Generation (TG) problem consists in finding an input vector test for some possible diagnosis (a set of faults) of a digital circuit. Such tests may have ...
BMCBI
2008
15 years 1 months ago
2008
Background: We consider effects of dependence among variables of high-dimensional data in multiple hypothesis testing problems, in particular the False Discovery Rate (FDR) contro...
118
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ESE
2006
15 years 1 months ago
2006
This paper presents results from a comparative evaluation of five combination strategies. Combination strategies are test case selection methods that combine "interesting&quo...