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DAC
2008
ACM
16 years 18 days ago
Statistical modeling and simulation of threshold variation under dopant fluctuations and line-edge roughness
The threshold voltage (Vth) of a nanoscale transistor is severely affected by random dopant fluctuations and line-edge roughness. The analysis of these effects usually requires at...
Yun Ye, Frank Liu, Sani R. Nassif, Yu Cao
MM
2004
ACM
99views Multimedia» more  MM 2004»
15 years 5 months ago
Locality preserving clustering for image database
It is important and challenging to make the growing image repositories easy to search and browse. Image clustering is a technique that helps in several ways, including image data ...
Xin Zheng, Deng Cai, Xiaofei He, Wei-Ying Ma, Xuey...
BMCBI
2010
157views more  BMCBI 2010»
14 years 11 months ago
SeqTrim: a high-throughput pipeline for pre-processing any type of sequence read
Background: High-throughput automated sequencing has enabled an exponential growth rate of sequencing data. This requires increasing sequence quality and reliability in order to a...
Juan Falgueras, Antonio J. Lara, Noé Fern&a...