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ITC
2000
IEEE
84views Hardware» more  ITC 2000»
15 years 8 months ago
Non-intrusive BIST for systems-on-a-chip
1 The term "functional BIST" describes a test method to control functional modules so that they generate a deterministic test set, which targets structural faults within ...
Silvia Chiusano, Paolo Prinetto, Hans-Joachim Wund...
VISSYM
2007
15 years 7 months ago
Animation of Orthogonal Texture-Based Vector Field Visualization
This paper introduces orthogonal vector field visualization on 2D manifolds: a representation by lines that are perpendicular to the input vector field. Line patterns are generate...
Sven Bachthaler, Daniel Weiskopf
USENIX
2008
15 years 7 months ago
Cutting Corners: Workbench Automation for Server Benchmarking
A common approach to benchmarking a server is to measure its behavior under load from a workload generator. Often a set of such experiments is required-perhaps with different serv...
Piyush Shivam, Varun Marupadi, Jeffrey S. Chase, T...
WSC
2008
15 years 7 months ago
Automated execution of simulation studies demonstrated via a simulation of a car
In the automotive area, a huge number of different technologies were developed in the last couples of years. The car manufacturers have to meet the challenge of selecting the most...
Sven Dominka, Eduard Broecker, Frank Schiller
DAC
2005
ACM
15 years 6 months ago
Path delay test compaction with process variation tolerance
In this paper we propose a test compaction method for path delay faults in a logic circuit. The method generates a compact set of two-pattern tests for faults on long paths select...
Seiji Kajihara, Masayasu Fukunaga, Xiaoqing Wen, T...