1 The term "functional BIST" describes a test method to control functional modules so that they generate a deterministic test set, which targets structural faults within ...
Silvia Chiusano, Paolo Prinetto, Hans-Joachim Wund...
This paper introduces orthogonal vector field visualization on 2D manifolds: a representation by lines that are perpendicular to the input vector field. Line patterns are generate...
A common approach to benchmarking a server is to measure its behavior under load from a workload generator. Often a set of such experiments is required-perhaps with different serv...
Piyush Shivam, Varun Marupadi, Jeffrey S. Chase, T...
In the automotive area, a huge number of different technologies were developed in the last couples of years. The car manufacturers have to meet the challenge of selecting the most...
In this paper we propose a test compaction method for path delay faults in a logic circuit. The method generates a compact set of two-pattern tests for faults on long paths select...