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» Efficiently generating test vectors with state pruning
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ICAI
2009
14 years 7 months ago
On the Construction of Initial Basis Function for Efficient Value Function Approximation
- We address the issues of improving the feature generation methods for the value-function approximation and the state space approximation. We focus the improvement of feature gene...
Chung-Cheng Chiu, Kuan-Ta Chen
DATE
2006
IEEE
82views Hardware» more  DATE 2006»
15 years 3 months ago
Concurrent core test for SOC using shared test set and scan chain disable
A concurrent core test approach is proposed to reduce the test cost of SOC. Multiple cores in SOC can be tested simultaneously by using a shared test set and scan chain disable. P...
Gang Zeng, Hideo Ito
PTS
2008
165views Hardware» more  PTS 2008»
14 years 11 months ago
Test Plan Generation for Concurrent Real-Time Systems Based on Zone Coverage Analysis
The state space explosion due to concurrency and timing constraints of concurrent real-time systems (CRTS) presents significant challenges to the verification engineers. In this pa...
Farn Wang, Geng-Dian Huang
DATE
2007
IEEE
81views Hardware» more  DATE 2007»
15 years 3 months ago
Using the inter- and intra-switch regularity in NoC switch testing
This paper proposes an efficient test methodology to test switches in a Network-on-Chip (NoC) architecture. A switch in an NoC consists of a number of ports and a router. Using th...
Mohammad Hosseinabady, Atefe Dalirsani, Zainalabed...
DFT
2003
IEEE
98views VLSI» more  DFT 2003»
15 years 2 months ago
Constrained ATPG for Broadside Transition Testing
In this paper, we propose a new concept of testing only functionally testable transition faults in Broadside Transition testing via a novel constrained ATPG. For each functionally...
Xiao Liu, Michael S. Hsiao