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VLSID
2007
IEEE
15 years 10 months ago
2007
IEEE
Accurate electrical masking modeling represents a significant challenge in soft error rate analysis for combinational logic circuits. In this paper, we use table lookup MOSFET mode...
VLSID
2007
IEEE
15 years 10 months ago
2007
IEEE
Abstract-- This paper presents the results obtained from an experimental study of the impact of modern process technologies on the electrical parameters of interconnects. Variation...
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Voted
HICSS
2002
IEEE
15 years 2 months ago
2002
IEEE
We analyze alternative market designs for a multisettlement system for electricity in which the resolution of the transmission network model is increased as time approaches real-t...
SIGCOMM
2010
ACM
14 years 10 months ago
2010
ACM
Several powerful forces are gathering to make fundamental and irrevocable changes to the century-old grid. The nextgeneration grid, often called the `smart grid,' will featur...
Presentation
Presented at First Electrical Science Divisional Symposium, Indian Institute of Science.
This is joint work with Prof David Parkes, Harvard University.