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142
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DAC
2005
ACM
16 years 5 months ago
2005
ACM
Achieving design closure is one of the biggest headaches for modern VLSI designers. This problem is exacerbated by high-level design automation tools that ignore increasingly impo...
107
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DAC
2005
ACM
16 years 5 months ago
2005
ACM
As the process technology enters the nanometer era, reliability has become a major concern in the design and manufacturing of VLSI circuits. In this paper we focus on one reliabil...
155
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DAC
2006
ACM
16 years 5 months ago
2006
ACM
Ever-growing complexity is forcing design to move above RTL. For example, golden functional models are being written as clearly as possible in software and not optimized or intend...
102
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DAC
2006
ACM
16 years 5 months ago
2006
ACM
Antenna effect may damage gate oxides during plasma-based fabrication process. The antenna ratio of total exposed antenna area to total gate oxide area is directly related to the ...
160
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WWW
2006
ACM
16 years 5 months ago
2006
ACM
In most web sites, web-based applications (such as web portals, emarketplaces, search engines), and in the file systems of personal computers, a wide variety of schemas (such as t...