257 search results - page 13 / 52 » Electronic circuit reliability modeling |
66
Voted
DATE
2009
IEEE
15 years 4 months ago
2009
IEEE
Abstract—This work proposes reliability aware through silicon via (TSV) planning for the 3D stacked silicon integrated circuits (ICs). The 3D power distribution network is modele...
103
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ISQED
2006
IEEE
15 years 3 months ago
2006
IEEE
— Negative Bias Temperature Instability (NBTI) has the potential to become one of the main show-stoppers of circuit reliability in nanometer scale devices due to its deleterious ...
ISQED
2009
IEEE
15 years 4 months ago
2009
IEEE
Abstract — Nanoelectronic design faces unprecedented reliability challenges and must achieve noise immunity and delay insensitiveness in the presence of prevalent defects and sig...
GLVLSI
2010
IEEE
15 years 2 months ago
2010
IEEE
Graphene nanoribbon tunneling FETs (GNR TFETs) are promising devices for post-CMOS low-power applications because of the low subthreshold swing, high Ion/Ioff, and potential for l...
GECCO
2007
Springer
15 years 3 months ago
2007
Springer
Design for specific customer service plays a crucial role for the majority of the market in modern electronics. However, adaptability to an individual customer results in increasi...