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» Electronic circuit reliability modeling
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151
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ISPD
2006
ACM
103views Hardware» more  ISPD 2006»
15 years 7 months ago
High accurate pattern based precondition method for extremely large power/ground grid analysis
In this paper, we propose more accurate power/ground network circuit model, which consider both via and ground bounce effects to improve the performance estimation accuracy of on-...
Jin Shi, Yici Cai, Sheldon X.-D. Tan, Xianlong Hon...
112
Voted
ONDM
2007
15 years 3 months ago
Optical IP Switching for Dynamic Traffic Engineering in Next-Generation Optical Networks
WDM technology has increased network link capacity dramatically, moving the network bottleneck from the transport to the routing layer. Hybrid electro-optical architectures seem at...
Marco Ruffini, Donal O'Mahony, Linda Doyle
ICCAD
2010
IEEE
125views Hardware» more  ICCAD 2010»
14 years 12 months ago
Peak current reduction by simultaneous state replication and re-encoding
Reducing circuit's peak current plays an important role in circuit reliability in deep sub-micron era. For sequential circuits, it is observed that the peak current has a str...
Junjun Gu, Gang Qu, Lin Yuan, Qiang Zhou
93
Voted
ICCAD
2008
IEEE
106views Hardware» more  ICCAD 2008»
15 years 10 months ago
Process variability-aware transient fault modeling and analysis
– Due to reduction in device feature size and supply voltage, the sensitivity of digital systems to transient faults is increasing dramatically. As technology scales further, the...
Natasa Miskov-Zivanov, Kai-Chiang Wu, Diana Marcul...
GLVLSI
2010
IEEE
183views VLSI» more  GLVLSI 2010»
15 years 3 months ago
Semi-analytical model for schottky-barrier carbon nanotube and graphene nanoribbon transistors
This paper describes a physics-based semi-analytical model for Schottky-barrier carbon nanotube (CNT) and graphene nanoribbon (GNR) transistors. The model includes the treatment o...
Xuebei Yang, Gianluca Fiori, Giuseppe Iannaccone, ...