2361 search results - page 423 / 473 » Embedded Systems - Challenges and Work Directions |
SRDS
2006
IEEE
15 years 3 months ago
2006
IEEE
Failure models characterise the expected component failures in fault-tolerant computing. In the context of distributed systems, a failure model usually consists of two parts: a fu...
MICRO
2005
IEEE
15 years 3 months ago
2005
IEEE
Dynamic voltage and frequency scaling (DVFS) is an effective technique for controlling microprocessor energy and performance. Existing DVFS techniques are primarily based on hardw...
IUI
2004
ACM
15 years 3 months ago
2004
ACM
Technical support procedures are typically very complex. Users often have trouble following printed instructions describing how to perform these procedures, and these instructions...
EUROSYS
2009
ACM
15 years 1 months ago
2009
ACM
Weakly consistent replication of data has become increasingly important both for loosely-coupled collections of personal devices and for large-scale infrastructure services. Unfor...
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FMICS
2006
Springer
15 years 1 months ago
2006
Springer
Abstract. Bounded model checking (BMC) based on satisfiability testing (SAT) has been introduced as a complementary technique to BDDbased symbolic model checking of LTL properties ...