855 search results - page 13 / 171 » Embedded core testing using genetic algorithms |
DATE
2002
IEEE
15 years 4 months ago
2002
IEEE
We present a new test resource partitioning (TRP) technique for reduced pin-count testing of system-on-a-chip (SOC). The proposed technique is based on test data compression and o...
VLSID
2002
IEEE
16 years 14 hour ago
2002
IEEE
IDDQ testing has been used as a test technique to supplement voltage testing of CMOS chips. The idea behind IDDQ testing is to declare a chip as faulty if the steady-state current...
JUCS
2006
14 years 11 months ago
2006
Abstract: Advances in technology now make it possible to integrate hundreds of cores (e.g. general or special purpose processors, embedded memories, application specific components...
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CEC
2009
IEEE
15 years 6 months ago
2009
IEEE
— In this paper, the performance assessment of the hybrid Archive-based Micro Genetic Algorithm (AMGA) on a set of bound-constrained synthetic test problems is reported. The hybr...
ICANNGA
2007
Springer
15 years 5 months ago
2007
Springer
Abstract. A new Genetic Programming variant called Liquid State Genetic Programming (LSGP) is proposed in this paper. LSGP is a hybrid method combining a dynamic memory for storing...