485 search results - page 7 / 97 » Embedded intelligent SRAM |
MTDT
2003
IEEE
15 years 2 months ago
2003
IEEE
ct Defect-based testing for digital logic concentrates primarily on methods of test application, including for example at-speed structural tests and IDDQ testing. In contrast, defe...
68
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FPL
2005
Springer
15 years 3 months ago
2005
Springer
Benefits of Field Programmable Gate Arrays (FPGAs) have lead to a spectrum of use ranging from consumer products to astronautics. This diversity necessitates the need to evaluate ...
112
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CSREAESA
2008
14 years 11 months ago
2008
A group testing-based BIST technique to identify faulty hard cores in FPGA devices is presented. The method provides for isolation of faults in embedded cores as demonstrated by ex...
VLSID
2004
IEEE
15 years 10 months ago
2004
IEEE
We present a new design of an Embedded Speech Recognition System. It combines the aspects of both hardware and software design to implement a speaker dependent, isolated word, sma...
MTDT
2003
IEEE
15 years 2 months ago
2003
IEEE
Memory cores (especially SRAM cores) used on a system chip usually come from a memory compiler. Commercial memory compilers have their limitation— a large memory may need to be ...