13 search results - page 3 / 3 » Emerging Yield and Reliability Challenges in Nanometer CMOS ... |
ICCAD
2008
IEEE
15 years 6 months ago
2008
IEEE
– Due to reduction in device feature size and supply voltage, the sensitivity of digital systems to transient faults is increasing dramatically. As technology scales further, the...
TVLSI
2002
14 years 9 months ago
2002
Abstract--This paper provides a high level survey of the increasing effects of on-chip inductance. These effects are classified into desirable and nondesirable effects. Among the u...
MICRO
2009
IEEE
15 years 4 months ago
2009
IEEE
With continued advances in CMOS technology, parameter variations are emerging as a major design challenge. Irregularities during the fabrication of a microprocessor and variations...