3 search results - page 1 / 1 » Emulation-Based Analysis of Soft Errors in Deep Sub-micron C... |
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VTS
2000
IEEE
15 years 2 months ago
2000
IEEE
The performance of deep sub-micron designs can be affected by various parametric variations, manufacturing defects, noise or even modeling errors that are all statistical in natur...
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FPL
2003
Springer
15 years 3 months ago
2003
Springer
ISVLSI
2006
IEEE
15 years 4 months ago
2006
IEEE
FinFET technology has been proposed as a promising alternative for deep sub-micro bulk CMOS technology, because of its better scalability. Previous work have studied the performan...