1943 search results - page 136 / 389 » End-to-End Integration Testing |
126
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IFIP12
2004
15 years 5 months ago
2004
: The experience from years of development and use, the advance of technology, and the development of authoring tools for questions and tests has resulted in a sophisticated, compu...
142
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DAC
2002
ACM
16 years 5 months ago
2002
ACM
At-speed testing of high-speed circuits is becoming increasingly difficult with external testers due to the growing gap between design and tester performance, growing cost of high...
153
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GLVLSI
2005
IEEE
15 years 10 months ago
2005
IEEE
We develop a novel on-line built-in self-test (BIST) technique for testing FPGAs that has a very high diagnosability even in presence of clustered faults, a fault pattern for whic...
141
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DFT
1999
IEEE
15 years 8 months ago
1999
IEEE
In the last decade, researchers have devoted increasing efforts to reduce the average power consumption in VLSI systems during normal operation mode, while power consumption durin...
171
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SOFTVIS
2010
ACM
15 years 4 months ago
2010
ACM
Multi-core processors have become increasingly prevalent, driving a software shift toward concurrent programs which best utilize these processors. Testing and debugging concurrent...