1943 search results - page 210 / 389 » End-to-End Integration Testing |
130
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SIGIR
2002
ACM
15 years 4 months ago
2002
ACM
We propose a formal model of Cross-Language Information Retrieval that does not rely on either query translation or document translation. Our approach leverages recent advances in...
140
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ICCAD
2010
IEEE
15 years 2 months ago
2010
IEEE
In this paper, we propose a new technique, referred to as MultiWafer Virtual Probe (MVP) to efficiently model wafer-level spatial variations for nanoscale integrated circuits. Tow...
169
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ICCD
2008
IEEE
16 years 1 months ago
2008
IEEE
— Verification remains an integral and crucial phase of today’s microprocessor design and manufacturing process. Unfortunately, with soaring design complexities and decreasing...
146
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MICRO
2007
IEEE
15 years 11 months ago
2007
IEEE
As silicon process technology scales deeper into the nanometer regime, hardware defects are becoming more common. Such defects are bound to hinder the correct operation of future ...
157
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WSC
1998
15 years 6 months ago
1998
Emulation is the process of exactly imitating a real system. Recent advances in simulation technology make it possible to emulate real world control systems by using a system'...