1943 search results - page 284 / 389 » End-to-End Integration Testing |
158
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DATE
2006
IEEE
15 years 10 months ago
2006
IEEE
For CMOS technologies below 65nm, gate oxide direct tunneling current is a major component of the total power dissipation. This paper presents a simulated annealing based algorith...
138
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DELTA
2006
IEEE
15 years 10 months ago
2006
IEEE
In high speed digital circuits, the inductive effect is more dominant compared to capacitive effect. In particular, as the technology is shrinking, the spacing between interconnec...
110
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DSD
2006
IEEE
15 years 10 months ago
2006
IEEE
Modern day applications require use of multi-processor systems for reasons of scalability and power efficiency. As more and more applications are integrated on a single device, m...
122
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ESCIENCE
2006
IEEE
15 years 10 months ago
2006
IEEE
Many areas of science currently use computing resources as a important part of their research, and many research groups adopt cluster architecture to use them efficiently and mana...
119
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HICSS
2006
IEEE
15 years 10 months ago
2006
IEEE
The future of mobile telephony is expected to rely on mobile services and the use of mobile services will be an integral part of the revenues to be generated by third generation m...