For the last few years a considerable number of efforts have been devoted into integrating security issues into information systems development practices. This has led to a number...
We describe an application of data mining and decision analysis to the problem of die-level functional test in integrated circuit manufacturing. Integrated circuits are fabricated...
As the density of VLSI circuits increases it becomes attractive to integrate dedicated test logic on a chip. This Built-in Self-Test (BIST) approach not only offers economic benef...
e instantiation is the transformation of abstract test cases cutable test scripts. Abstract test cases are either created during model based test case generation or are manually d...
Information Extraction (IE) — the problem of extracting structured information from unstructured text — has become the key enabler for many enterprise applications such as sem...
Laura Chiticariu, Vivian Chu, Sajib Dasgupta, Thil...