1943 search results - page 33 / 389 » End-to-End Integration Testing |
102
Voted
ETS
2011
IEEE
14 years 6 days ago
2011
IEEE
—In-field diagnosability of electronic components in larger systems such as automobiles becomes a necessity for both customers and system integrators. Traditionally, functional ...
100
Voted
GLVLSI
2002
IEEE
15 years 5 months ago
2002
IEEE
We present a novel test scheduling algorithm for embedded corebased SoC’s. Given a system integrated with a set of cores and a set of test resources, we select a test for each c...
94
Voted
DDECS
2007
IEEE
15 years 6 months ago
2007
IEEE
1-The increasing cost for System-on-Chip (SOC) testing is mainly due to the huge test data volumes that lead to long test application time and require large automatic test equipmen...
127
Voted
ISSRE
2000
IEEE
15 years 4 months ago
2000
IEEE
The emphasis in object-oriented programs is on defining abstractions that have both state and behavior. This emphasis causes a shift in focus from software units to the way softw...
DATE
2009
IEEE
15 years 7 months ago
2009
IEEE
Core-based system-on-chips (SoCs) fabricated on threedimensional (3D) technology are emerging for better integration capabilities. Effective test architecture design and optimizat...