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84
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ICCAD
2000
IEEE
95views Hardware» more  ICCAD 2000»
15 years 4 months ago
Test of Future System-on-Chips
Spurred by technology leading to the availability of millions of gates per chip, system-level integration is evolving as a new paradigm, allowing entire systems to be built on a s...
Yervant Zorian, Sujit Dey, Mike Rodgers
91
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SE
2007
15 years 1 months ago
Scientific software test management - a research agenda
: The application of scientifically derived theories on software testing strongly depends on their ability to provide a value for practice. We provide a comprehensive review on the...
Lars Karg, Dirk Voelz
100
Voted
CSSC
2010
123views more  CSSC 2010»
15 years 18 days ago
Testing Fractional Order of Long Memory Processes: A Monte Carlo Study
Testing the fractionally integrated order of seasonal and non-seasonal unit roots is quite important for the economic and financial time series modelling. In this paper, Robinson ...
Laurent Ferrara, Dominique Guegan, Zhiping Lu
68
Voted
DATE
2009
IEEE
244views Hardware» more  DATE 2009»
15 years 7 months ago
Contactless testing: Possibility or pipe-dream?
The traditionally wired interfaces of many electronic systems are in many applications being replaced by wireless interfaces. Testing of electronic systems (both integrated circui...
Erik Jan Marinissen, Dae Young Lee, John P. Hayes,...
GLVLSI
2002
IEEE
108views VLSI» more  GLVLSI 2002»
15 years 5 months ago
Protected IP-core test generation
Design simplification is becoming necessary to respect the target time-to-market of SoCs, and this goal can be obtained by using predesigned IP-cores. However, their correct inte...
Alessandro Fin, Franco Fummi