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105
Voted
DATE
2002
IEEE
89views Hardware» more  DATE 2002»
15 years 5 months ago
A Hierarchical Test Scheme for System-On-Chip Designs
System-on-chip (SOC) design methodology is becoming the trend in the IC industry. Integrating reusable cores from multiple sources is essential in SOC design, and different design...
Jin-Fu Li, Hsin-Jung Huang, Jeng-Bin Chen, Chih-Pi...
QSIC
2005
IEEE
15 years 6 months ago
Towards a Metamorphic Testing Methodology for Service-Oriented Software Applications
Testing applications in service-oriented architecture (SOA) environments needs to deal with issues like the unknown communication partners until the service discovery, the impreci...
W. K. Chan, S. C. Cheung, Karl R. P. H. Leung
FATES
2005
Springer
15 years 6 months ago
Testing Systems of Concurrent Black-Boxes-An Automata-Theoretic and Decompositional Approach
The global testing problem studied in this paper is to seek a definite answer to whether a system of concurrent black-boxes has an observable behavior in a given finite (but cou...
Gaoyan Xie, Zhe Dang
96
Voted
VLSID
2004
IEEE
135views VLSI» more  VLSID 2004»
16 years 27 days ago
Integrating Self Testability with Design Space Exploration by a Controller based Estimation Technique
Recent research for testable designs has focussed on inserting test structures by re-arranging an Register-TransferLevel (RTL) data path generated from a behavioural description t...
M. S. Gaur, Mark Zwolinski
84
Voted
DATE
2008
IEEE
174views Hardware» more  DATE 2008»
15 years 7 months ago
Calibration of Integrated CMOS Hall Sensors Using Coil-on-Chip in ATE Environment
Due to high demand for hall sensors mostly in the automotive and industrial applications, development and manufacturing of hall sensors in System-on-Chip (SoC) became more importa...
Mustafa Badaroglu, Guy Decabooter, Francois Laulan...