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95
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DELTA
2002
IEEE
15 years 5 months ago
European Network for Test Education
 The European network for Integrated Circuit testing education described in this paper addresses the shortage of skill in mixed-signal production testing by encouraging students...
Yves Bertrand, Marie-Lise Flottes, Florence Aza&iu...
105
Voted
DATE
2000
IEEE
134views Hardware» more  DATE 2000»
15 years 5 months ago
An on Chip ADC Test Structure
In this paper, a new built-in self-test structure to test the static specifications of analog to digital converters (ADCs) is presented. A ramp signal generated by an integrator ...
Yun-Che Wen, Kuen-Jong Lee
85
Voted
DATE
1997
IEEE
74views Hardware» more  DATE 1997»
15 years 4 months ago
Efficient and accurate testing of analog-to-digital converters using oscillation-test method
This paper describes a practical test approach for analog-to-digital converters (ADCs) based on the oscillation-test strategy. The oscillation-test is applied to convert the ADC u...
Karim Arabi, Bozena Kaminska
AOSE
2008
Springer
15 years 2 months ago
Experimental Evaluation of Ontology-Based Test Generation for Multi-agent Systems
Abstract. Software agents are a promising technology for today's complex, distributed systems. Methodologies and techniques that address testing and reliability of multi agent...
Cu D. Nguyen, Anna Perini, Paolo Tonella
84
Voted
DAC
2001
ACM
16 years 1 months ago
Testing for Interconnect Crosstalk Defects Using On-Chip Embedded Processor Cores
Crosstalk effects degrade the integrity of signals traveling on long interconnects and must be addressed during manufacturing testing. External testing for crosstalk is expensive ...
Li Chen, Xiaoliang Bai, Sujit Dey