1943 search results - page 6 / 389 » End-to-End Integration Testing |
85
Voted
ICCAD
2000
IEEE
15 years 2 months ago
2000
IEEE
In this paper, we present a novel approach to use test stimuli generated by digital components of a mixed-signal circuit for testing its analog components. A wavelet transform is ...
122
Voted
PTS
2010
14 years 8 months ago
2010
We present a novel algorithm for test data generation that is based on techniques used in formal software verification. Prominent examples of such formal techniques are symbolic ex...
76
Voted
ISPDC
2006
IEEE
15 years 4 months ago
2006
IEEE
This article shows how the idea of continuous software testing [23] of a world wide working group can be well integrated into the Grid Computing paradigm using the Globus Toolkit ...
83
Voted
TE
2010
14 years 5 months ago
2010
The semiconductor industry is lacking qualified integrated circuit (IC) test engineers to serve in the field of mixed-signal electronics. The absence of mixed-signal IC test educat...
ICCAD
2009
IEEE
14 years 8 months ago
2009
IEEE
As the complexity of integrated circuits has increased, so has the need for improving testing efficiency. Unfortunately, the types of defects are also becoming more complex, which...