1943 search results - page 98 / 389 » End-to-End Integration Testing |
112
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DAC
2006
ACM
16 years 5 months ago
2006
ACM
The delay fault test pattern set generated by timing unaware commercial ATPG tools mostly affects very short paths, thereby increasing the escape chance of smaller delay defects. ...
150
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ISQED
2006
IEEE
15 years 10 months ago
2006
IEEE
— With advanced VLSI manufacturing technology in deep submicron (DSM) regime, we can integrate entire electronic systems on a single chip (SoC). Due to the complexity in SoC desi...
128
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NPAR
2006
ACM
15 years 10 months ago
2006
ACM
We present techniques to create convincing high-quality watercolor illustrations of plants. Mainly focusing on the real-time rendering, we introduce methods to abstract the visual...
142
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QSIC
2005
IEEE
15 years 9 months ago
2005
IEEE
Database application programs typically contain program units that use SQL statements to manipulate records in database instances. Testing the correctness of data manipulation by ...
137
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APN
1993
Springer
15 years 8 months ago
1993
Springer
In this paper we show how to extend Coloured Petri Nets (CP-nets), with three new modelling primitives—place capacities, test arcs and inhibitor arcs. The new modelling primitiv...