Substantial increase in leakage current and threshold voltage fluctuations are making design of robust wide fan-in dynamic gates a challenging task. Traditionally, a PMOS keeper t...
Hamed F. Dadgour, Rajiv V. Joshi, Kaustav Banerjee
In a circuit environment that is becoming increasingly sensitive to dynamic power dissipation and noise, and where cycle time available for control decisions continues to decrease...
Hans M. Jacobson, Prabhakar Kudva, Pradip Bose, Pe...