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ISPW
2005
IEEE
15 years 9 months ago
Application of the V-Modell XT - Report from a Pilot Project
Marco Kuhrmann, Dirk Niebuhr, Andreas Rausch
ISPW
2005
IEEE
15 years 9 months ago
A Framework for Coping with Process Evolution
Brian A. Nejmeh, William E. Riddle
KBSE
2005
IEEE
15 years 9 months ago
Constraint-based test data generation in the presence of stack-directed pointers
Arnaud Gotlieb, Tristan Denmat, Bernard Botella