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228
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Publication
Within-die process variations arise during integrated circuit (IC) fabrication in the sub-100nm regime. These variations are of paramount concern as they deviate the performance of...
151
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ICIP
2008
IEEE
16 years 5 months ago
2008
IEEE
We present a novel approach to the problem of detection of visual similarity between a template image, and patches in a given image. The method is based on the computation of a lo...
141
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DAC
2008
ACM
16 years 5 months ago
2008
ACM
: Spin-Torque Transfer Magnetic RAM (STT MRAM) is a promising candidate for future universal memory. It combines the desirable attributes of current memory technologies such as SRA...
121
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DAC
2007
ACM
16 years 5 months ago
2007
ACM
The number and magnitude of process variation sources are increasing as we scale further into the nano regime. Today's most successful response surface methods limit us to lo...
107
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DAC
1998
ACM
16 years 4 months ago
1998
ACM
In this paper we present a statistical method for estimating the maximum power consumption in VLSI circuits. The method is based on the theory of extreme order statistics applied ...