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ISQED
2006
IEEE
107views Hardware» more  ISQED 2006»
16 years 5 days ago
Impact of Gate-Length Biasing on Threshold-Voltage Selection
Gate-length biasing is a runtime leakage reduction technique that leverages on the short-channel effect by marginally increasing the gate-length of MOS devices to significantly ...
Andrew B. Kahng, Swamy Muddu, Puneet Sharma
ISSRE
2006
IEEE
16 years 5 days ago
Detecting Redundant Unit Tests for AspectJ Programs
Aspect-oriented software development is gaining popularity with the adoption of languages such as AspectJ. Testing is an important part in any software development, including aspe...
Tao Xie, Jianjun Zhao, Darko Marinov, David Notkin
ISVLSI
2006
IEEE
114views VLSI» more  ISVLSI 2006»
16 years 5 days ago
A Low Power Lookup Technique for Multi-Hashing Network Applications
Many network security applications require large virus signature sets to be maintained, retrieved, and compared against the network streams. Software applications frequently fail ...
Ilhan Kaya, Taskin Koçak
MIAR
2006
IEEE
16 years 5 days ago
A General Learning Framework for Non-rigid Image Registration
This paper presents a general learning framework for non-rigid registration of MR brain images. Given a set of training MR brain images, three major types of information are partic...
Guorong Wu, Feihu Qi, Dinggang Shen
TABLETOP
2006
IEEE
16 years 5 days ago
Multi-User Interface and Interactions on Direct-Touch Horizontal Surfaces: Collaborative Tabletop Research at MERL
While “displays” have the connotation of affording visual output, “surfaces” invite the users to interact. What happens then when the surfaces are also displays, when a di...
Chia Shen