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134
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DATE
2002
IEEE
99views Hardware» more  DATE 2002»
15 years 9 months ago
Gate Level Fault Diagnosis in Scan-Based BIST
A gate level, automated fault diagnosis scheme is proposed for scan-based BIST designs. The proposed scheme utilizes both fault capturing scan chain information and failing test v...
Ismet Bayraktaroglu, Alex Orailoglu
109
Voted
HICSS
2002
IEEE
82views Biometrics» more  HICSS 2002»
15 years 9 months ago
Customer Role Ambiguity in Community Management
This paper examines challenges involved in managing product-centered communities. Using the notion of customer role ambiguity, the paper explores the ambiguity involved in balanci...
Helena Holmström, Ola Henfridsson
MFCS
2009
Springer
15 years 8 months ago
Sampling Edge Covers in 3-Regular Graphs
An edge cover C of an undirected graph is a set of edges such that every vertex has an adjacent edge in C. We show that a Glauber dynamics Markov chain for edge covers mixes rapidl...
Ivona Bezáková, William A. Rummler
GI
2001
Springer
15 years 8 months ago
Cost and Quality-of-Service-aware Network Service Deployment
Abstract: This paper presents the information aggregation methods enabling cost- and QoS-aware service deployment. It is expected that network management tools will require the net...
Robert Haas, Patrick Droz, Burkhard Stiller
ICANN
2001
Springer
15 years 8 months ago
Scalable Kernel Systems
Kernel-based systems are currently very popular approaches to supervised learning. Unfortunately, the computational load for training kernel-based systems increases drastically wit...
Volker Tresp, Anton Schwaighofer