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APLAS
2000
ACM
15 years 2 months ago
Kima - An Automated Error Correction System for Concurrent Logic Programs
We have implemented Kima, an automated error correction system for concurrent logic programs. Kima corrects near-misses such as wrong variable occurrences in the absence of explici...
Yasuhiro Ajiro, Kazunori Ueda
VLSID
2009
IEEE
87views VLSI» more  VLSID 2009»
15 years 10 months ago
Soft Error Rates with Inertial and Logical Masking
We analyze the neutron induced soft error rate (SER). An induced error pulse is modeled by two parameters, probability of occurrence and probability density function of the pulse ...
Fan Wang, Vishwani D. Agrawal
TCAD
2008
101views more  TCAD 2008»
14 years 9 months ago
Using Field-Repairable Control Logic to Correct Design Errors in Microprocessors
Functional correctness is a vital attribute of any hardware design. Unfortunately, due to extremely complex architectures, widespread components, such as microprocessors, are often...
Ilya Wagner, Valeria Bertacco, Todd M. Austin
DATE
2006
IEEE
120views Hardware» more  DATE 2006»
15 years 4 months ago
Soft delay error analysis in logic circuits
— In this paper, we present an analysis methodology to compute circuit node sensitivity due to charged particle induced delay (timing) errors, Soft Delay Errors (SDE). We define...
Balkaran S. Gill, Christos A. Papachristou, Franci...
CHI
2010
ACM
15 years 4 months ago
Average task times in usability tests: what to report?
The distribution of task time data in usability studies is positively skewed. Practitioners who are aware of this positive skew tend to report the sample median. Monte Carlo simul...
Jeff Sauro, James R. Lewis