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80
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WWW
2005
ACM
16 years 1 months ago
Debugging OWL ontologies
As an increasingly large number of OWL ontologies become available on the Semantic Web and the descriptions in the ontologies become more complicated, finding the cause of errors ...
Bijan Parsia, Evren Sirin, Aditya Kalyanpur
VLSID
2004
IEEE
117views VLSI» more  VLSID 2004»
16 years 1 months ago
Evaluating the Reliability of Defect-Tolerant Architectures for Nanotechnology with Probabilistic Model Checking
As we move from deep submicron technology to nanotechnology for device manufacture, the need for defect-tolerant architectures is gaining importance. This is because, at the nanos...
Gethin Norman, David Parker, Marta Z. Kwiatkowska,...
103
Voted
ICCD
2004
IEEE
138views Hardware» more  ICCD 2004»
15 years 9 months ago
Design and Implementation of Scalable Low-Power Montgomery Multiplier
In this paper, an efficient Montgomery multiplier is introduced for the modular exponentiation operation, which is fundamental to numerous public-key cryptosystems. Four aspects a...
Hee-Kwan Son, Sang-Geun Oh
98
Voted
PEPM
2009
ACM
15 years 9 months ago
Program transformation for numerical precision
This article introduces a new program transformation in order to enhance the numerical accuracy of floating-point computations. We consider that a program would return an exact r...
Matthieu Martel
95
Voted
ASPDAC
2009
ACM
212views Hardware» more  ASPDAC 2009»
15 years 7 months ago
Timing analysis and optimization implications of bimodal CD distribution in double patterning lithography
Abstract— Double patterning lithography (DPL) is in current production for memory products, and is widely viewed as inevitable for logic products at the 32nm node. DPL decomposes...
Kwangok Jeong, Andrew B. Kahng